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Semiconductor measurements and instr...
~
Runyan, W. R.
Semiconductor measurements and instrumentation /
紀錄類型:
書目-語言資料,印刷品 : 單行本
正題名/作者:
Semiconductor measurements and instrumentation // W.R. Runyan and T.J. Shaffner.
其他題名:
Semiconductor measurements & instrumentation
作者:
Runyan, W. R.
其他作者:
Shaffner, T. J.
出版者:
New York :McGraw-Hill Companies, Inc.,1998.
面頁冊數:
x, 454 p. :ill. ;24 cm.
叢書名:
McGraw-Hill international English language series
標題:
Semiconductors. -
ISBN:
0070576971 (pbk.) :
ISBN:
0071167218 (international ed.)
Semiconductor measurements and instrumentation /
Runyan, W. R.
Semiconductor measurements and instrumentation /
Semiconductor measurements & instrumentation W.R. Runyan and T.J. Shaffner. - 2nd ed. - New York :McGraw-Hill Companies, Inc.,1998. - x, 454 p. :ill. ;24 cm. - McGraw-Hill international English language series.
Includes bibliographical references and index.
ISBN: 0070576971 (pbk.) :NT1067
LCCN: 97026081 Subjects--Topical Terms:
146950
Semiconductors.
LC Class. No.: QC611.24 / .R86 1998
Dewey Class. No.: 621.3815/2/0287
Semiconductor measurements and instrumentation /
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