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Fault-tolerance and reliability techniques for high-density random-access memories /

紀錄類型:	書目-語言資料,印刷品 : 單行本
正題名/作者:	Fault-tolerance and reliability techniques for high-density random-access memories // Kanad Chakraborty, Pinaki Mazumder.
作者:	Chakraborty, Kanad.
其他作者:	Mazumder, Pinaki.
出版者:	Upper Saddle River, NJ :Prentice Hall,c2002.
面頁冊數:	xix, 426 p. :ill. ;25 cm.
叢書名:	Prentice Hall modern semiconductor design series
標題:	Random access memory - Reliability. -
ISBN:	0130084654 (hbk.) :

Fault-tolerance and reliability techniques for high-density random-access memories /
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003 DLC
005 20031120112644.0
008 020624s2002 njua b 001 0 eng
010 $a 2002027055
020 $a 0130084654 (hbk.) : $c NT1053
035 $a 00074865
040 $a DLC $c DLC $d DLC
042 $a pcc
050 0 0 $a TK7895.M4 $b C44 2002
082 0 0 $a 621.39/73 $2 21
092 $a */621.3973/C435/2002////E01958
100 1 $a Chakraborty, Kanad. $3 160174
245 1 0 $a Fault-tolerance and reliability techniques for high-density random-access memories / $c Kanad Chakraborty, Pinaki Mazumder.
260 $a Upper Saddle River, NJ : $b Prentice Hall, $c c2002.
300 $a xix, 426 p. : $b ill. ; $c 25 cm.
440 0 $a Prentice Hall modern semiconductor design series
504 $a Includes bibliographical references (p. 377-417) and index.
650 0 $a Random access memory $x Reliability. $3 160176
650 0 $a Integrated circuits $x Fault tolerance. $3 160177
650 0 $a Semiconeductor storage devices. $3 160178
700 1 $a Mazumder, Pinaki. $3 160175