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Journal of electronic testing :theor...
~
IEEE Computer Society., Technical Council on Test Technology.
Journal of electronic testing :theory and applications : (JETTA).
紀錄類型:
書目-語言資料,印刷品 : 連續性出版品
正題名/作者:
Journal of electronic testing :/
其他題名:
theory and applications : (JETTA).
其他題名:
Theory and applications : (JETTA)
出版者:
Boston, U.S.A. :Springer1990-
面頁冊數:
v. :ill. ;26 cm.
刊期註:
Bimonthly,
標題:
Electronic apparatus and appliances - Periodicals. - Testing -
電子資源:
Address for accessing the journal using authorization number and password through OCLC FirstSearch Electronic Collections Online. Subscription to online journal required for access to abstracts and full text
電子資源:
Address for accessing the journal from an authorized IP address through OCLC FirstSearch Electronic Collections Online. Subscription to online journal required for access to abstracts and full text
電子資源:
http://www.wkap.nl/jrnltoc.htm/0923-8174
ISSN:
0923-8174
館藏註:
合訂本 館藏區域:七樓過期期刊區 V.27 N.1,2011/2 - V.28 N.6 ,2012/12
Journal of electronic testing :theory and applications : (JETTA).
Journal of electronic testing :
theory and applications : (JETTA).Theory and applications : (JETTA) - Boston, U.S.A. :Springer1990- - v. :ill. ;26 cm. - Bimonthly,<Apr. 1995- > - Four no. a year - Vol. 1, no. 1 (Feb. 1990)-
A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010->
合訂本 館藏區域:七樓過期期刊區 V.27 N.1,2011/2 - V.28 N.6 ,2012/12
ISSN: 0923-8174 = Journal of electronic testing = J. electron. test
CODEN: JTTAER
Kluwer Academic Publishers, PO Box 358, Accord Station, Hingham, MA 02018-0358
LCCN: 95657656
Nat. Bib. No.: 015656748dnb
Nat. Bib. Agency Control No.: 1033317-4DE-600Subjects--Topical Terms:
193961
Electronic apparatus and appliances
--Testing--Periodicals.
LC Class. No.: TK7869 / .J68
Dewey Class. No.: 621.3815/48/05
Journal of electronic testing :theory and applications : (JETTA).
LDR
:02691cas _2200553 a_450
001
150249
003
OCoLC
005
20110630093841.0
007
cr cnu||||||||
008
900824c19909999nyu#r p 0 a0eng c
010
$a
95657656
$z
sn 90018222
012
$i
9604
$k
1
$m
1
015
$2
dnb
$a
015656748
016
7
$2
DE-600
$a
1033317-4
022
#
$2
j
$a
0923-8174
$l
0923-8174
029
1
$a
NLGGC
$b
051788594
029
1
$a
NZ1
$b
2268383
029
1
$a
AU@
$b
000007499699
029
1
$a
AU@
$b
000026178427
029
1
$a
HEBIS
$b
048551368
029
1
$a
DEBBG
$b
BV004247301
029
1
$a
GBVCP
$b
130869090
030
$a
JTTAER
032
$a
006089
$b
USPS
035
$a
00142682
037
$b
Kluwer Academic Publishers, PO Box 358, Accord Station, Hingham, MA 02018-0358
040
$a
NDD
$c
NDD
$d
ELM
$d
NSD
$d
NST
$d
NSD
$d
CAS
$d
NST
$d
DLC
$d
OCL
$d
CUS
$d
OCL
$d
OCLCQ
$d
DLC
$d
OCLCQ
$d
HEBIS
$d
DEBBG
$d
CLU
$d
GBVCP
$d
TW4O4
042
$a
pcc
$a
nsdp
049
$a
NKCA
050
0 0
$a
TK7869
$b
.J68
082
0 0
$2
20
$a
621.3815/48/05
210
0 #
$a
J. electron. test
222
0
$a
Journal of electronic testing
245
0 0
$a
Journal of electronic testing :
$b
theory and applications : (JETTA).
246
3 0
$a
Theory and applications : (JETTA)
246
3 0
$a
JETTA
260
#
$3
1990- :
$a
Boston, U.S.A. :
$c
1990-
$b
Springer
$b
Kluwer Academic Publishers,
260
3
$3
<2010->:
$a
New York :
300
$a
v. :
$b
ill. ;
$c
26 cm.
310
$a
Bimonthly,
$b
<Apr. 1995- >
321
$a
Four no. a year
362
0
$a
Vol. 1, no. 1 (Feb. 1990)-
530
$a
Also available via World Wide Web at the Kluwer web site;
$b
and at OCLC FirstSearch Electronic Collections Online;
$c
Subscription required for access to abstracts and full text.
550
$a
A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010->
563
$a
合訂本 館藏區域:七樓過期期刊區 V.27 N.1,2011/2 - V.28 N.6 ,2012/12
588
$a
Latest issue consulted: Vol. 26, no. 1 (Feb. 2010).
650
# 0
$a
Electronic apparatus and appliances
$x
Testing
$v
Periodicals.
$3
193961
650
0 7
$a
Elektrische Messtechnik.
$2
swd
$3
193962
650
0 7
$a
Elektronik.
$2
swd
$3
193963
650
0 7
$a
Elektronisches Bauelement.
$2
swd
$3
193964
650
0 7
$a
Test.
$2
swd
$3
193965
650
0 7
$a
Testen.
$2
gtt
$3
180030
650
0 7
$a
Zeitschrift.
$2
swd
$3
193966
710
2 #
$a
IEEE Computer Society.
$b
Technical Council on Test Technology.
$3
193960
776
0 8
$i
Online version:
$t
Journal of electronic testing (Online)
$w
(DLC) 2004229188
$w
(OCoLC)38266720
$x
1573-0727
856
7 #
$2
http
$u
http://firstsearch.oclc.org
$z
Address for accessing the journal using authorization number and password through OCLC FirstSearch Electronic Collections Online. Subscription to online journal required for access to abstracts and full text
856
7 #
$2
http
$u
http://firstsearch.oclc.org/journal=0923-8174;screen=info;ECOIP
$z
Address for accessing the journal from an authorized IP address through OCLC FirstSearch Electronic Collections Online. Subscription to online journal required for access to abstracts and full text
856
4 1
$u
http://www.wkap.nl/jrnltoc.htm/0923-8174
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七樓過期期刊區
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典藏地名稱:
七樓過期期刊區
3 筆 • 頁數 1 •
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P20340
七樓過期期刊區
不外借
裝訂期刊(西文)
*P 621.381548 J86 2011 V.27 N.1- V.27 N.4
一般(Normal)
在架
0
P20341
七樓過期期刊區
不外借
裝訂期刊(西文)
*P 621.381548 J86 2011-2012 V.27 N.5- V.28 N.2
一般(Normal)
在架
0
P20342
七樓過期期刊區
不外借
裝訂期刊(西文)
*P 621.381548 J86 2012 V.28 N.3- V.28 N.6
一般(Normal)
在架
0
3 筆 • 頁數 1 •
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