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Design and analysis of integrator-ba...

Leung, Vincent W.

Design and analysis of integrator-based log-domain filter circuits

Record Type:	Electronic resources : Monograph/item
Title/Author:	Design and analysis of integrator-based log-domain filter circuits/ Gordon W. Roberts and Vincent W. Leung.
Author:	Roberts, Gordon W.,
other author:	Leung, Vincent W.
Published:	New York :Kluwer Academic,c2002.
Description:	1 online resource (xxiii, 254 p.) :ill.
Subject:	Log domain filters - Design and construction. -
Online resource:	Click here for online access to this book (查閱全文) (EBSCO eBook)
ISBN:	0306470543 (electronic bk.)
ISBN:	9780306470547 (electronic bk.)
ISBN:	9780306475443 (electronic bk.)
ISBN:	0306475448 (electronic bk.)

Design and analysis of integrator-based log-domain filter circuits
Roberts, Gordon W.,1959-

Design and analysis of integrator-based log-domain filter circuits[electronic resource] /Gordon W. Roberts and Vincent W. Leung. - New York :Kluwer Academic,c2002. - 1 online resource (xxiii, 254 p.) :ill. - The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing,5340893-3405 ;. - International series in engineering and computer science.Analog circuits and signal processing ;534..

Includes bibliographical references and index.

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

ISBN: 0306470543 (electronic bk.)Subjects--Topical Terms:

1000073632
Log domain filters
--Design and construction.Index Terms--Genre/Form:

172687
Electronic books.

LC Class. No.: TK7872.F5 / R63 2002eb

Dewey Class. No.: 621.3815/324

Design and analysis of integrator-based log-domain filter circuits
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