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Oxide reliability :a summary of silicon oxide wearout, breakdown, and reliability /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Oxide reliability :/ editor, D.J. Dumin.
Reminder of title:	a summary of silicon oxide wearout, breakdown, and reliability /
other author:	Dumin, D. J.
Published:	[River Edge, NJ] :World Scientific,c2002.
Description:	ix, 270 p. :ill. ;26 cm.
Series:	Selected topics in electronics and systems ;
Subject:	Metal oxide semiconductors - Reliability. -
ISBN:	9810248423 (hbk.) :

Oxide reliability :a summary of silicon oxide wearout, breakdown, and reliability /
Oxide reliability :a summary of silicon oxide wearout, breakdown, and reliability /editor, D.J. Dumin. - [River Edge, NJ] :World Scientific,c2002. - ix, 270 p. :ill. ;26 cm. - Selected topics in electronics and systems ;v. 23.

Includes bibliographical references.

ISBN: 9810248423 (hbk.) :NT2276

LCCN: 2002279812Subjects--Topical Terms:

159245
Metal oxide semiconductors
--Reliability.

LC Class. No.: TK7871.99.M44 / O95 2002

Dewey Class. No.: 621.39/732

Oxide reliability :a summary of silicon oxide wearout, breakdown, and reliability /
LDR:00719cam _22002174a_450 001 136392
003 DLC
005 20031019193355.0
008 020514s2002 njua b 000 0 eng
010 $a 2002279812
020 $a 9810248423 (hbk.) : $c NT2276
035 $a 00074368
040 $a DLC $c DLC $d DLC
042 $a pcc
050 0 0 $a TK7871.99.M44 $b O95 2002
082 0 0 $a 621.39/732 $2 21
092 $a */621.39/O98/2002////E00994
245 0 0 $a Oxide reliability : $b a summary of silicon oxide wearout, breakdown, and reliability / $c editor, D.J. Dumin.
260 $a [River Edge, NJ] : $b World Scientific, $c c2002.
300 $a ix, 270 p. : $b ill. ; $c 26 cm.
440 0 $a Selected topics in electronics and systems ; $v v. 23
504 $a Includes bibliographical references.
650 0 $a Metal oxide semiconductors $x Reliability. $3 159245
650 0 $a Silicon oxide $x Deterioration. $3 159246
700 1 $a Dumin, D. J. $3 159244